Skip to content
Sectors
Consumer Electronics
Automotive
Avionics
Cosmetics
Defense
Labs test
Products
AR/VR Solution
Viewing Angle
Viewing Angle NIR
Viewing Angle Multi-Spectral
Response Time Products
Imaging
Thermal Test Products
Applications
Augmented & Virtual Reality
Interior Monitoring System
Facial Recognition
Self Driving Car
Production Line
Physico-realistic aspect simulation
Innovative Technologies LIDAR & VCSELs
Display analysis
Standard displays
Microdisplays
3D Displays
Optical manufacturing
Traditional Manufacturing
CNC Manufacturing
Optical Design
Control
Assembly room
Traceability and Quality
Partners
News
Sectors
Consumer Electronics
Automotive
Avionics
Cosmetics
Defense
Labs test
Products
AR/VR Solution
Viewing Angle
Viewing Angle NIR
Viewing Angle Multi-Spectral
Response Time Products
Imaging
Thermal Test Products
Applications
Augmented & Virtual Reality
Interior Monitoring System
Facial Recognition
Self Driving Car
Production Line
Physico-realistic aspect simulation
Innovative Technologies LIDAR & VCSELs
Display analysis
Standard displays
Microdisplays
3D Displays
Optical manufacturing
Traditional Manufacturing
CNC Manufacturing
Optical Design
Control
Assembly room
Traceability and Quality
Partners
News
Contact
Sectors
Consumer Electronics
Automotive
Avionics
Cosmetics
Defense
Labs test
Products
AR/VR Solution
Viewing Angle
Viewing Angle NIR
Viewing Angle Multi-Spectral
Response Time Products
Imaging
Thermal Test Products
Applications
Augmented & Virtual Reality
Interior Monitoring System
Facial Recognition
Self Driving Car
Production Line
Physico-realistic aspect simulation
Innovative Technologies LIDAR & VCSELs
Display analysis
Standard displays
Microdisplays
3D Displays
Optical manufacturing
Traditional Manufacturing
CNC Manufacturing
Optical Design
Control
Assembly room
Traceability and Quality
Partners
News
Polytec GmbH
Discover our solutions
Home
|
Polytec GmbH
ELDIM’s equipment for fast, angle-dependent characterisation of NIR emitter
Learn more
Polytec GmbH exhibiting the New ELDIM system for NIR characterization at Laser World of Photonics in Münich
Learn more