Imaging

Discover our solutions

UMaster
UMaster imaging equipment allows to measure luminance and color. UMaster uses an objective telecentric...
XSCOPE
The Xscope has been designed specifically to assess the quality of Micro Displays with very precise...

What Purpose ?

Applications

ELDIM’s imaging solutions meet the growing demand for precise display quality testing. Our equipment serves various applications, including color and luminance measurements, as well as pixel uniformity testing. These solutions are crucial for industries like OLED/LCD production, AR/VR devices, and wearable technologies.

  • UMaster: Specifically designed for general display quality control, UMaster excels in measuring luminance and color uniformity on displays such as TVs, monitors, and large-scale screens. Thanks to its high transmission filters and motorized color wheel, it delivers outstanding sensitivity and accuracy, making it perfect for display calibration.

  • XScope: Engineered for microdisplay testing, XScope focuses on pixel uniformity, pixel variability, and precision measurements below 5µm. It is ideal for high-resolution displays used in augmented reality (AR), virtual reality (VR), and wearable devices, ensuring maximum accuracy in demanding applications.

As display technology evolves rapidly, manufacturers face the challenge of creating smaller and more efficient microdisplays. Reducing display size while enhancing performance requires precise measurement and characterization of these miniature components.

The difficulty increases when maintaining exceptional quality and consistency, which is crucial for applications like augmented reality, virtual reality, and high-resolution displays.

To tackle these challenges, specialized imaging solutions are essential.

ELDIM’s XScope imaging photometer is specifically engineered to address the complexities of measuring microdisplays. It offers several key advantages, making it the optimal choice for overcoming miniaturization hurdles:

  • Precision Measurement: Below 5µm

  • Advanced Capabilities: Detects faulty pixels, measures pixel variability and uniformity, enables brightness correction

  • Trade-off Optimization: Optimizes field of view, stitching, working distance, and modulation transfer function (MTF)