EZWAVE-TTO 120 latest ELDIM product
The EZWAVE-TTO 120 was at the center of ELDIM’s showcase during IMOTOP 2025. The event gathered researchers, engineers, and industry specialists, offering an ideal opportunity to present our latest optical metrology developments in a dynamic and collaborative environment.
A Successful Edition for Dialogue and Innovation
Throughout the three days in Lille, our team had the opportunity to engage with visitors and discuss current challenges in optical measurement. These conversations highlighted the need for reliable and flexible tools capable of delivering accurate results across a wide variety of applications. The event also confirmed the growing interest in advanced characterization solutions for displays, imaging, and optical materials.
👉 Learn more about the EZWAVE family
Why This New System Attracted Attention
Precision for Advanced Testing
One of the main reasons professionals visited our booth was to discover the capabilities of the EZWAVE-TTO 120. The system offers wide-angle optical analysis, supporting demanding measurement scenarios in both research and industrial environments. Its stable design, without moving parts, ensures excellent repeatability and helps users achieve consistent results.
Stable Spectral Performance and Uniformity
Another key topic of interest was the system’s ability to maintain spectral stability across its full range. This makes it suitable for uniformity studies, material behavior evaluation, and optical component characterization. Thanks to its robust architecture, the solution provides dependable measurements even under challenging conditions.
Other Technologies Featured at the Booth
In addition to this new system, visitors discovered the CubeX-500, our multispectral angular measurement solution. Its ability to measure luminance, color, and viewing-angle characteristics with its compact size makes it ideal for production environment measurement.
👉 Discover CubeX-500
👉 Visit IMOTOP
Thank You for Visiting Us at IMOTOP
We would like to thank all attendees who took the time to meet with us. Their feedback and enthusiasm motivate us to continue developing high-performance optical metrology solutions. We look forward to seeing you at upcoming events throughout the year.
