ELDIM at SPIE AR VR MR 2026
SPIE AR | VR | MR 2026: A Great Opportunity to Connect with the XR Community
ELDIM recently participated in the SPIE AR | VR | MR 2026 expo, held in San Francisco as part of Photonics West. The event once again brought together researchers, engineers, and industry leaders working on the future of augmented, virtual, and mixed reality technologies.
Over the three days of the exhibition, our team had the pleasure of meeting many professionals from the XR ecosystem and welcoming numerous visitors to booth #6412. These discussions were a great opportunity to exchange ideas about current challenges in XR display testing and to explore new collaboration opportunities.
During the event, visitors discovered live demonstrations of ELDIM’s measurement solutions dedicated to AR/VR/MR displays, including XSCOPE and EZLite-N2. These systems are designed to provide accurate optical measurements and support manufacturers and researchers in improving display performance, color accuracy, and overall visual quality.
The strong interest shown during the exhibition confirms the growing need for reliable optical metrology solutions as XR technologies continue to evolve rapidly. Events like SPIE AR | VR | MR provide valuable opportunities to share expertise, discuss industry trends, and better understand the needs of the XR community.
ELDIM would like to thank everyone who visited our booth and took the time to discuss their projects with our team. These exchanges are essential to continue developing solutions that meet the expectations of the next generation of immersive display technologies.
If you would like to continue the conversation or learn more about our optical measurement solutions for XR displays, feel free to contact us at sales@eldim.fr.
You can also explore our dedicated page for AR/VR/MR measurement solutions:
https://eldim.com/ar-vr-mr/
Keep connected for next year event SPIE AR VR MR 2026 Event website
