EZWAVE-200: High-Precision Viewing Angle Measurement System for Advanced Display Testing
At Display Week exhibition 2025, ELDIM unveiled its latest innovation: the EZWave-200. This next-generation viewing angle measurement system drew significant attention thanks to its unique design, hyperspectral capabilities, and unmatched measurement speed. Developed for engineers and researchers working with cutting-edge display technologies, the EZWAVE-200 sets a new standard in optical metrology.
Hyperspectral Technology for Unmatched Measurement Precision
At the core of the EZWAVE-200 is an advanced hyperspectral spectrophotometry engine. Offering up to 1 nm spectral resolution, the system captures full spectral information across the entire field of view, enabling highly detailed pixel-by-pixel analysis of emitted light.
Unlike traditional systems, the EZWAVE-200 includes no moving components such as shutters or color wheels. This ensures long-term stability, industrial reliability, and minimal maintenance. It is ideally suited for both R&D laboratories and production environments.
Key technology features:
- 5-second acquisition time — no moving parts, faster results
- Down to 1nm spectral resolution for unmatched color accuracy
- Designed for R&D, quality control, and production lines
Reliable Performance for Demanding Applications
The EZWAVE-200 is designed for long-term use in both R&D and production environments. Its design includes no moving parts, ensuring excellent mechanical stability, and high repeatability over time. This makes it particularly suited for intensive, repeated measurement cycles in industrial settings.
Powerful and Intuitive Software Platform
The EZWAVE-200 comes with dedicated software platform, offering a simple yet powerful interface optimized for measurement tasks.
- Web-based application, OS-agnostic: compatible with desktops, run stations, and tablets
- Operates directly on the embedded CPU of the system
- User APIs available via:
- Web services
- COAXPress interface
With its measurement-oriented user interface, EZWAVE-200 streamlines data acquisition, visualization, and integration, ensuring smooth operation whether you’re in a lab or on production line.
Built for High Resolution Display Metrology
The EZWAVE-200 is tailored for the characterization of OLED, microLED, QD, and other emissive displays, where high spatial and spectral accuracy are essential. Its ability to measure spectral data at the pixel level makes it the ideal tool for qualifying next-generation display panels.
Designed to meet the needs of display manufacturers, optical engineers, and quality control teams, the EZWAVE-200 is a powerful, future ready solution for demanding optical metrology applications.
Now available for order
The EZWAVE-200 is now available for order. Contact our team to schedule a live demo, request technical documentation, or discuss your application needs.
